These values are MI-503 molecular weight comparable to the values of E 0 for dilute nitrides reported in the literature: approximately 6 meV for a GaInNAs multiple QW structure with 1.5% of nitrogen  and approximately 9 meV for a GaInNAs epilayer with 1% of nitrogen . Conclusions In conclusion, 1.3-μm GaInNAsSb QWs annealed at various temperatures (from 680°C to 800°C in 20°C steps) were studied by low-temperature TRPL. It has been shown PHA-848125 that exciton dynamics in these QWs change significantly
with annealing temperature. Due to carrier localization, strong energy dependence of the PL decay time is observed for all samples at low temperatures. This energy dependence was fitted by a phenomenological formula that assumes an exponential distribution selleck chemicals llc of localized states. The average value of E 0, which describes the energy distribution of localized states, has been extracted from this fit, and its dependence on annealing temperature was studied. The smallest value of E 0 was observed for the GaInNAsSb QW annealed at 700°C. In addition, the PL decay time measured at the peak PL energy was compared for all
samples. The longest PL decay time was also observed for the QW annealed at 700°C. Based on these parameters that describe the carrier dynamics at low temperature, it can be concluded that the optimal annealing temperature for this QW is approximately 700°C. Acknowledgements This work was performed within the grant of the National Science Centre (no. 2012/07/E/ST3/01742). MB acknowledges the support from the MNiSW within the Iuventus Plus program (IP2011 001471). References 1. Shan W, Walukiewicz W, Ager JW, Haller EE, Geisz JF, Friedman DJ, Olson JM, Kurtz SR: Band anticrossing in GaInNAs alloys. Phys Rev Lett 1999, 82:1221–1224.CrossRef 2. Choquette KD, Klem JF, Fischer AJ, Blum O, Allerman AA, Fritz IJ, Kurtz SR, Breiland WG, Sieg R, Geib KM, Scott JW, Naone RL: Room temperature continuous wave
InGaAsN quantum well vertical-cavity lasers emitting at 1.3 μm. Electron Lett 2000, 36:1388.CrossRef 3. Tansu N, Mawst LJ: Temperature sensitivity of 1300-nm InGaAsN quantum-well lasers. IEEE Photonics Technol Lett 2002, Loperamide 14:1052–1054.CrossRef 4. Jaschke G, Averbeck R, Geelhaar L, Riechert H: Low threshold InGaAsN/GaAs lasers beyond 1500 nm. J Cryst Growth 2005, 278:224–228.CrossRef 5. Wang XJ, Puttisong Y, Tu CW, Ptak AJ, Kalevich VK, Egorov AY, Geelhaar L, Riechert H, Chen WM, Buyanova IA: Dominant recombination centers in Ga(In)NAs alloys: Ga interstitials. Appl Phys Lett 2009, 95:241904.CrossRef 6. Chen WM, Buyanova IA, Tu CW: Defects in dilute nitrides: significance and experimental signatures. Optoelectron IEE Proc 2004, 151:379–384.CrossRef 7. Krispin P, Gambin V, Harris JS, Ploog KH: Nitrogen-related electron traps in Ga(As, N) layers (≤3% N). J Appl Phys 2003, 93:6095–6099.CrossRef 8. Spruytte SG, Coldren CW, Harris JS, Wampler W, Krispin P, Ploog K, Larson MC: Incorporation of nitrogen in nitride-arsenides: origin of improved luminescence efficiency after anneal.